ZFor the 20th consecutive time, HITEC Messtechnik attended the International Trade Fair for Quality Assurance, Control. This year, Control once again offered an ideal platform for professional exchange, new impulses, and engaging discussions on the topic of quality assurance. At our exhibition stand, we were able to welcome numerous visitors and present our innovations in the fields of optical metrology and hand-held measuring instruments.

We were particularly pleased by the great interest in new functions such as wireless data transmission for hand-held measuring instruments, which demonstrate how daily production can be made more efficient. The personal conversations with users, partners, and long-time companions provided valuable feedback and new ideas for future developments.

In addition to presenting our products, our primary focus was on direct dialogue, for which Control has provided the perfect setting for years. This confirms every year how important personal exchange is in an increasingly digital world.

We sincerely thank all visitors for their interest, the stimulating discussions, and the trust placed in us. We are already looking forward to the next Control.